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Our TT-AFM Atomic Force Microscope allows nanoscale topographical imaging as well as force and stiffness measurement. Unlike fluorescence microscopy, AFM is not limited by the diffraction limit of light, so features as small as several nanometers are routinely resolvable. Because the technique is fundamentally a mechanical measurement, it lends itself well to biomechanical characterization, such as measurement of molecular unfolding or stiffness measurements. Imaging or measurements can be made both on dry or wet samples.
Example Applications
- Nanoscale surface imaging
- Young’s modulus/stiffness measurement
- Nucleoprotein force measurement
- Phase separation characterization
- Cellular stiffness measurement
Key Features
- 0.4nm height resolution
- Environmental cell for fluid imaging and force-distance measurements
- 50um x 50um scan region
Resources
- TT-AFM User guide
- Biological Sample Prep App Note (Digital Instruments)
- Measuring and Understanding Force-Distance Curves
- Advanced Force-Distance Guide
